IEEE North Atlantic Test Workshop(NATW 2017)

RI, USA 

May 8-10, 2017

Call for Papers :

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. In addition to traditional topics, the 26th NATW will feature a general theme of "Synthesis and Reliability

Topics of Interest :

• Analog, Mixed Signal & RF Testing
• Built-In Self-Test (BIST)
• Board and Package Level Testing
• Delay & Performance Testing
• Design Verification/Validation
• Diagnosis and Debug
• Fault Modeling/Simulation
• FPGA& Embedded CoreTesting
• IDDQ Testing
• DFM, Defect Analysis& Defect-Based Testing
• Memory & MEMS Testing
• Nanotechnology Testing
• Online Testing
• System-on-Chip (SOC) Test & Debug
• Test Quality/System Reliability

IMPORTANT DATES

• Abstract submission deadline: March 01,2017

• Full Paper Submission deadline:  March 01,2017

• Final submission deadline: April 24,2017

• Notification of acceptance date: April 10,2017

User Name : jerish
Posted 26-11-2016 on 10:07:26 AEDT

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