IEEE International Conference on Microelectronics
Views: 759
When : 2017-12-10
Where : Beirut,Lebanon
Submission Deadline : 2017-07-16
Categories : Digital Signal & Image Processing , Wireless Sensor Networks
IEEE International Conference on Microelectronics (ICM 2017)
December 10-13, 2017
Beirut, Lebanon
Call for Papers:
The objective of the workshop is to bring together industry and science by providing a platform for discussion, interaction and collaboration. Industrial papers should either describe challenges of system or software testing that could trigger future research activities or present comparable results of applying model-based security testing. Research papers are expected to present promising ideas or possible solutions to industrial challenges in the field of model-based security testing.
Topics:
- Analog and RF circuit design techniques
- BiCMOS, GaAs
- Device characterization and modeling
- Device physics and novel structures
- Digital signal and data processing
- Integrated antenna and front-end co-design
- MEMS Devices
- Nonlinear circuits
- Optical Communications
- Optoelectronics
- Packaging and surface mount technology
- Process technology, CMOS, BJT,
- Reliability and failure analysis
- Signal Processing in Communications
- System on Chip (SoCs)
- VLSI for Signal and Image Processing
- Wireless communication systems
Important Dates:
- Paper Submission: July 16, 2017
- Author Notification:September 18, 2017
- Final Version Due : October 13, 2017
User Name : Claude
Posted 21-03-2017 on 14:37:55 AEDT
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