CMOS Image Sensor Random Telegraph Noise Time Constant Extraction from Correlated to Uncorrelated Double Sampling
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Author : Calvin Yi-Ping Chao, Honyih Tu, Thomas Wu, Kuo-Yu Chou, Shang-Fu Yeh, and Fu-Lung Hsueh
Affiliation : Taiwan Semiconductor Manufacturing Company
Country : Taiwan
Category : Circuits
Volume, Issue, Month, Year : Volume PP, Issue 99, November, 2016
Abstract :
A new method for on-chip random telegraph noise (RTN) characteristic time constant extraction using the double sampling circuit in an 8.3 Mpixel CMOS image sensor (CIS) is described. The dependence of the measured RTN on the time
difference between the double sampling and the key equation used for time constant extraction are derived from the continuous time RTN model and the discrete event RTN m
Keyword : Random telegraph noise (RTN), CMOS image sensor (CIS), correlated double sampling (CDS)
URL : http://ieeexplore.ieee.org/document/7731134/
User Name : anikajosi
Posted 03-11-2016 on 10:45:30 AEDT
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