IEEE Workshop on Microelectronics and Electron Devices (WMED 2018)
April 20,2018
Boise, Idaho, USA

Call for Papers:

WMED 2018 will provide a forum for reviewing and discussing all aspects of micro- and nano-electronics including processing, electrical characterization, design, and new device technologies. This workshop will consist of invited talks, contributed papers, and a poster session throughout the day.

Topics of interest include but are not limited to, the following

• Microelectronic Device Processing and Process Integration
  
• Microelectronic Circuit Design​
• Microelectronic Device Electrical and Reliability Testing
• Semiconductor Packaging and Reliability
• New product design, high-speed and/or low-power design techniques
• Architectures and memory sensing schemes
• Dielectric reliability, Device reliability, Novel memory technology testing schemes
• CMOS technology, Product development (DRAM, SRAM, Flash, CMOS Imagers)
• DFM, Defect Analysis & Defect-Based Testing

Important Dates

Paper Submission Deadline	:	January 26,2018
Final submission deadline	:	March 08,2018
Acceptance Notification	:	March 15, 2018

User Name : alex
Posted 25-12-2017 on 15:46:09 AEDT

Related CFPs

RobCE 2026   2026 6th International Conference on Robotics and Control Engineering (RobCE 2026)
IJMECH   International Journal of Recent Advances in Mechanical Engineering
IJBBR   International Journal of BRIC Business Research(IJBBR)
ORAJ   Operations Research and Applications: An International Journal