3^rd IEEE Conference on E-Learning and innovation in EDucation (ELED 2020)

December 12-18, 2020, Agadir - Essaouira, Morocco

Scope & Topics

The 3^rd IEEE Conference on E-Learning and innovation in EDucation (ELED 2020) will be held in conjunction with the 6th IEEE International Congress on Information Science and Technology (IEEE CiSt\’20) the week of December 12th – 18th 2020 in Agadir – Essaouira, Morocco. The main objective of this conference is to bring together academic scientists, researchers and research scholars to exchange and share their experiences and research results about all aspects of e-Learning and Innovation in Education.

Therefore, authors of unpublished, original, in-progress or completed research works related to both technical and pedagogical aspects of e-learning are invited and encouraged to submit their papers to the international conference on E-Learning and innovative EDucation ELED'20.

Topics of interest include, but are not limited to, the following

• E-Learning tools, systems, and applications
• E-Learning Evaluation/Performance Measurement, Technology-enhanced Test & Assessment
• Personalized and Adaptive learning and applications
• Intelligent system in Education and Learning
• Data-driven Learning Analysis in Education
• Knowledge Management in E-Learning
• Wireless, Mobile, and Ubiquitous Learning and applications
• Virtual- and Game-based Learning and applications
• Interactive and Simulation-based Learning and applications
• Social- and Collaborative-based learning and applications
• Technology-enhanced Instructional and Curriculum Design
• Creation and Management of Object-based Learning Content (OLC)
• Massive Open Online Courses, Small Private Online Course and Flipped Classroom
• Virtual Universities, Classrooms, and Laboratories
• Educational Serious Games
• e-Laboratory
• Other Innovative and Advanced Research in eLearning

Paper Submission

Prospective authors should submit by using EDAS online paper submission platform , a paper up to 6 pages describing their original work using the IEEE template. Accepted papers will be published in the proceeding in the IEEE Xplore Library, Scopus and DBLP. Furthermore, authors of high quality contributions will be invited to submit an extended version of their work for potential publication in a special issue/section of an international journal.

Important Dates